This is the Fourth Quarterly Report on Contract DAAB07-76-C-0027; manufacturing methods and technology evaluation for the fabrication of thin film transistor based solid state displays. A significant reason has been uncovered for the difference in quality between displays fabricated on the laboratory X-Y units and the pilot line. This factor relates to mask contamination and transfer of the contaminants to the glass; the result is an increase in electrical shorts. A partial solution was implemented and a consequent improvement in display quality immediately evident although further advances are still required. Several more rigorous solutions are now being tested. The overall pilot line operational reliability improved with the introduction of modified procedures; the major residual problems is circuit opens and microcracked insulators both of which are thought at this time to be relatively minor. (Author)

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